ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE

An electronic device is provided and includes a substrate, a first contact pad, a second contact pad, an electronic element, and a third contact pad. The first contact pad and the second contact pad are disposed on the substrate. The electronic element is located above the substrate and electrically...

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Bibliographic Details
Main Authors Sung, Chao-Chin, Nien, Chueh-Yuan, Chu, Chien-Tzu
Format Patent
LanguageEnglish
Published 25.04.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An electronic device is provided and includes a substrate, a first contact pad, a second contact pad, an electronic element, and a third contact pad. The first contact pad and the second contact pad are disposed on the substrate. The electronic element is located above the substrate and electrically connected to the first contact pad and the second contact pad. The third contact pad is electrically connected to the first contact pad. A test method for an electronic device is also provided.
Bibliography:Application Number: US202318463317