GATE CHARGE AND LEAKAGE MEASUREMENT TEST SEQUENCE FOR SOLID STATE DEVICES

An apparatus comprises a switch and a capacitor connected to the switch and to a gate driver that drives a gate of a solid state device. The gate driver is operated to perform a test sequence for the solid state device. The test sequence includes turning on a switch and charging a capacitor to a sup...

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Bibliographic Details
Main Authors AICHRIEDLER, Leo, WRIESSNEGGER, Gerald
Format Patent
LanguageEnglish
Published 11.04.2024
Subjects
ALARM SYSTEMS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
ORDER TELEGRAPHS
PHYSICS
SIGNALLING
SIGNALLING OR CALLING SYSTEMS
TESTING
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Summary:An apparatus comprises a switch and a capacitor connected to the switch and to a gate driver that drives a gate of a solid state device. The gate driver is operated to perform a test sequence for the solid state device. The test sequence includes turning on a switch and charging a capacitor to a supply voltage during an initial phase. During a first phase, the switch and the solid state device are turned off, the gate driver is disconnected from the supply voltage, and the gate driver drives the gate of the solid state device based at least upon a charge of the capacitor. During a second phase, the gate driver drives the gate of the solid state device to turn on the solid state device. A gate charge at the gate of the solid state device is measured as an operational state of the solid state device.
Bibliography:Application Number: US202217961101