METHODS, APPARATUS, AND ARTICLES OF MANUFACTURE TO IDENTIFY CAUSES OF DEFECTS IN INDUSTRIAL ENVIRONMENTS
Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes interface circuitry to access data associated with an object in an environment and programmable circuitry to utilize machine-readable instruc...
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Format | Patent |
Language | English |
Published |
28.03.2024
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Abstract | Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes interface circuitry to access data associated with an object in an environment and programmable circuitry to utilize machine-readable instructions. For example, the programmable circuitry is to identify a cause of a defect of the object based on a timeline of the object in the environment, the timeline based on the data. |
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AbstractList | Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes interface circuitry to access data associated with an object in an environment and programmable circuitry to utilize machine-readable instructions. For example, the programmable circuitry is to identify a cause of a defect of the object based on a timeline of the object in the environment, the timeline based on the data. |
Author | Wouhaybi, Rita H Yarvis, Mark Mudgal, Priyanka |
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RelatedCompanies | Intel Corporation |
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Snippet | Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes... |
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Title | METHODS, APPARATUS, AND ARTICLES OF MANUFACTURE TO IDENTIFY CAUSES OF DEFECTS IN INDUSTRIAL ENVIRONMENTS |
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