METHODS, APPARATUS, AND ARTICLES OF MANUFACTURE TO IDENTIFY CAUSES OF DEFECTS IN INDUSTRIAL ENVIRONMENTS

Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes interface circuitry to access data associated with an object in an environment and programmable circuitry to utilize machine-readable instruc...

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Bibliographic Details
Main Authors Wouhaybi, Rita H, Yarvis, Mark, Mudgal, Priyanka
Format Patent
LanguageEnglish
Published 28.03.2024
Subjects
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Summary:Systems, apparatus, articles of manufacture, and methods are disclosed to identify causes of defects in industrial environments. An example apparatus includes interface circuitry to access data associated with an object in an environment and programmable circuitry to utilize machine-readable instructions. For example, the programmable circuitry is to identify a cause of a defect of the object based on a timeline of the object in the environment, the timeline based on the data.
Bibliography:Application Number: US202318531476