MEMBER FOR SEMICONDUCTOR MANUFACTURING APPARATUS
A member for semiconductor manufacturing apparatus of the present invention includes an AlN ceramic substrate with a surface provided with projections for wafer placement. At least part of an area, provided with no projection, of the AlN ceramic substrate has a surface layer region from the surface...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | English |
Published |
04.01.2024
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A member for semiconductor manufacturing apparatus of the present invention includes an AlN ceramic substrate with a surface provided with projections for wafer placement. At least part of an area, provided with no projection, of the AlN ceramic substrate has a surface layer region from the surface to a predetermined depth, and a base material region below the surface layer region. The predetermined depth is 5 μm or less. The oxygen content rate of the surface layer region is higher than the oxygen content rate of the base material region. |
---|---|
Bibliography: | Application Number: US202318467882 |