INTERCONNECT STRUCTURE HAVING DIFFERENT DIMENSIONS FOR CONNECTED CIRCUIT BLOCKS IN INTEGRATED CIRCUIT
A interconnect structure for an integrated circuit may include: a metal line including a plurality of sections having different thicknesses along a 1st direction; and a plurality of vias respectively protruding from the plurality of sections of the metal line.
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
14.12.2023
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Subjects | |
Online Access | Get full text |
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Summary: | A interconnect structure for an integrated circuit may include: a metal line including a plurality of sections having different thicknesses along a 1st direction; and a plurality of vias respectively protruding from the plurality of sections of the metal line. |
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Bibliography: | Application Number: US202217849345 |