Method of Forming a Semiconductor Device by Driving Hydrogen into a Dielectric Layer from Another Dielectric Layer
Embodiment described herein provide a thermal treatment process following a high-pressure anneal process to keep hydrogen at an interface between a channel region and a gate dielectric layer in a field effect transistor while removing hydrogen from the bulk portion of the gate dielectric layer. The...
Saved in:
Main Authors | , , , , , |
---|---|
Format | Patent |
Language | English |
Published |
30.11.2023
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Be the first to leave a comment!