Method of Forming a Semiconductor Device by Driving Hydrogen into a Dielectric Layer from Another Dielectric Layer

Embodiment described herein provide a thermal treatment process following a high-pressure anneal process to keep hydrogen at an interface between a channel region and a gate dielectric layer in a field effect transistor while removing hydrogen from the bulk portion of the gate dielectric layer. The...

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Bibliographic Details
Main Authors Peng, Chun-Yen, Chau, Cheng-Po, Chen, Yi-Fan, Ku, Wen-Yu, Chang, Huicheng, Luan, Hongfa
Format Patent
LanguageEnglish
Published 30.11.2023
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