RADIATION DETECTORS HAVING PEROVSKITE FILMS

Solid-state radiation detectors utilizing a film as an alpha detection layer are provided. The detector can include a neutron conversion layer disposed thereon to enable neutron detection. The film can detect alpha particles from the ambient environment or emitted by the neutron conversion layer (if...

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Bibliographic Details
Main Authors Mathew, Xavier, Quevedo Lopez, Manuel, Caraveo Frescas, Jesus Alfonso, Reyes Banda, Martin Gregorio, Molaei Imenabadi, Rouzbeh, Chavez-Urbiola, Iker Rodrigo, EI Bouanani, Lidia C, Fernandez Izquierdo, Leunam
Format Patent
LanguageEnglish
Published 05.10.2023
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:Solid-state radiation detectors utilizing a film as an alpha detection layer are provided. The detector can include a neutron conversion layer disposed thereon to enable neutron detection. The film can detect alpha particles from the ambient environment or emitted by the neutron conversion layer (if present) so the device can detect alpha particles and/or neutrons. The film can generate electron-hole pairs and can be disposed near a semiconductor material. The film can have a thickness of, for example, at least 100 nanometers.
Bibliography:Application Number: US202118042369