MEASURING APPARATUS

A measuring apparatus includes a light source configured to emit light in a mid-infrared region, the light including: first-wavelength light having a wave number of from 970 cm-1 or more to 1010 cm-1 or less; and second-wavelength light different from the first-wavelength light, the second-wavelengt...

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Bibliographic Details
Main Authors KASAHARA, Ryosuke, WADA, Yoshio, SASAKI, Toshihide, OBA, Yoshihiro
Format Patent
LanguageEnglish
Published 14.09.2023
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A measuring apparatus includes a light source configured to emit light in a mid-infrared region, the light including: first-wavelength light having a wave number of from 970 cm-1 or more to 1010 cm-1 or less; and second-wavelength light different from the first-wavelength light, the second-wavelength light having a wave number of from 950 cm-1 or more to 990 cm-1 or less; a photosensor configured to detect the light emitted from the light source and reflected by a measurement target; and an information processing device configured to: obtain a first absorbance of the first-wavelength light and a second absorbance of the second-wavelength light from an output of the photosensor; and determine a biomarker of the measurement target based on the first absorbance and the second absorbance.
Bibliography:Application Number: US202118014756