LINEAR DEFECT INSPECTION DEVICE

The present disclosure relates to a defect inspection device including: an imaging part that captures an image of a first frame having a predetermined width and a predetermined length along a width direction and a length direction of a test object, respectively; an image division part that divides t...

Full description

Saved in:
Bibliographic Details
Main Authors LEE, Kyung Do, YANG, Myoung Gon, KO, Young Woo, PARK, Jae Hyun
Format Patent
LanguageEnglish
Published 10.08.2023
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online AccessGet full text

Cover

More Information
Summary:The present disclosure relates to a defect inspection device including: an imaging part that captures an image of a first frame having a predetermined width and a predetermined length along a width direction and a length direction of a test object, respectively; an image division part that divides the image of the first frame of the test object captured by the imaging part into a plurality of second frames smaller than the first frame along the width direction of the test object; a brightness calculation part that measures a brightness value of each of the plurality of the second frames, and calculates a defect determination value of the first frame based on the brightness values of the plurality of the second frames; and a control part that determines a line defect existing along the length direction of the test object based on the calculated defect determination value of the first frame.
Bibliography:Application Number: US202118011810