METHOD FOR DETECTING INTENSITY PEAKS OF A SPECULARLY REFLECTED LIGHT BEAM

A method for identifying at least one intensity peak of a specularly reflected light beam including: a step (E1) of detecting at least one intensity peak of a light beam present in a first image taken at instant t; a step (E2) of calculating a vector (N) normal to a surface at each point of the firs...

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Bibliographic Details
Main Authors Lugez, Boris, Meneyrol, Thomas
Format Patent
LanguageEnglish
Published 03.08.2023
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Summary:A method for identifying at least one intensity peak of a specularly reflected light beam including: a step (E1) of detecting at least one intensity peak of a light beam present in a first image taken at instant t; a step (E2) of calculating a vector (N) normal to a surface at each point of the first image associated with an intensity peak detected in step (E1); a step (E3) of calculating a vector (L) of the direction of the incident light beam at each point of the first image taken at instant (t), associated with an intensity peak detected in step (E1); a step (E4) of determining the co-linearity between the normal vector (N) and the vector (L) of the direction of the incident light beam in order to identify an intensity peak of the specularly reflected light beam.
Bibliography:Application Number: US202017767630