SEMICONDUCTOR DEVICE METHOD FOR FORMING THE SAME
A semiconductor device is provided. The semiconductor device includes a substrate, a fin structure and an epitaxial source/drain structure. The substrate includes a substrate layer and an insulator layer on the substrate layer. The fin structure is formed over the substrate, wherein the fin structur...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
13.07.2023
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device is provided. The semiconductor device includes a substrate, a fin structure and an epitaxial source/drain structure. The substrate includes a substrate layer and an insulator layer on the substrate layer. The fin structure is formed over the substrate, wherein the fin structure includes a gate structure and channel layers wrapped by the gate structure. The epitaxial source/drain structure is connected to the channel layers, wherein a bottom portion of the epitaxial source/drain structure is in contact with the insulator layer of the substrate. |
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Bibliography: | Application Number: US202218064431 |