METHOD AND DEVICE FOR TESTING WAFER, ELECTRONIC DEVICE AND STORAGE MEDIUM

The present disclosure provides a method and a device for testing a wafer, an electronic device, and storage medium, wherein the method includes: obtaining plural test sheets; dividing the wafers to be tested in the plurality of test sheets according to individual test items in the plurality of test...

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Bibliographic Details
Main Author HAN, Lincheng
Format Patent
LanguageEnglish
Published 06.07.2023
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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