METHOD AND DEVICE FOR TESTING WAFER, ELECTRONIC DEVICE AND STORAGE MEDIUM

The present disclosure provides a method and a device for testing a wafer, an electronic device, and storage medium, wherein the method includes: obtaining plural test sheets; dividing the wafers to be tested in the plurality of test sheets according to individual test items in the plurality of test...

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Bibliographic Details
Main Author HAN, Lincheng
Format Patent
LanguageEnglish
Published 06.07.2023
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present disclosure provides a method and a device for testing a wafer, an electronic device, and storage medium, wherein the method includes: obtaining plural test sheets; dividing the wafers to be tested in the plurality of test sheets according to individual test items in the plurality of test sheets, and determining the wafers to be tested corresponding to individual divided units; determining a test sequence of the test items to be performed on each wafer to be tested, based on a test sequence condition of the test items in individual test sheets and a test condition of a testing machine corresponding to individual divided units; and testing the wafer to be tested, according to the test sequence of the test items to be performed on any of the wafers to be tested.
Bibliography:Application Number: US202217899274