Supercritical Fluid Cleaning for Components in Optical or Electron Beam Systems
To clean components in semiconductor manufacturing equipment, such as an optical system or an electron beam system, a component is heated in a chamber. A supercritical fluid formulation is applied to the component in the chamber, which removes molecular and/or particulate contaminants. The supercrit...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
22.06.2023
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Subjects | |
Online Access | Get full text |
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Summary: | To clean components in semiconductor manufacturing equipment, such as an optical system or an electron beam system, a component is heated in a chamber. A supercritical fluid formulation is applied to the component in the chamber, which removes molecular and/or particulate contaminants. The supercritical fluid formulation can include one or more of carbon dioxide, water, HCF, alkane, alkene, nitrous oxide, methanol, ethanol, or acetone. |
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Bibliography: | Application Number: US202218078913 |