Supercritical Fluid Cleaning for Components in Optical or Electron Beam Systems

To clean components in semiconductor manufacturing equipment, such as an optical system or an electron beam system, a component is heated in a chamber. A supercritical fluid formulation is applied to the component in the chamber, which removes molecular and/or particulate contaminants. The supercrit...

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Bibliographic Details
Main Authors Jiang, Eric, Rose, Garry, Taylor, Boyd, Sun, Jiulong, Ehsani, Ali
Format Patent
LanguageEnglish
Published 22.06.2023
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Summary:To clean components in semiconductor manufacturing equipment, such as an optical system or an electron beam system, a component is heated in a chamber. A supercritical fluid formulation is applied to the component in the chamber, which removes molecular and/or particulate contaminants. The supercritical fluid formulation can include one or more of carbon dioxide, water, HCF, alkane, alkene, nitrous oxide, methanol, ethanol, or acetone.
Bibliography:Application Number: US202218078913