SEMICONDUCTOR CHIP AND TEST METHOD OF THE SAME

• Main Authors: Kwak, Min Woo, Lee, Kwan Seong, Lee, Jae Ho, Choi, Jae Seung, Jung, Yeon Ho, Kim, Mi Joung, Byun, Do Hoon, Choi, Hwang Ho, Kye, Jong Wook, Park, Chan Wook
• Format: Patent
• Language: English
• Published: 08.06.2023
• Subjects: BASIC ELECTRONIC CIRCUITRY; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; PULSE TECHNIQUE; TESTING

A semiconductor chip includes a semiconductor device connected between a first node to which a power supply voltage is applied and a second node to which a ground voltage is applied, a first ring oscillator connected to the first node through a first supply switch and the second node through a first...