CIRCUITS AND TECHNIQUES FOR MODELING REMAINING LIFE OF SEMICONDUCTOR CIRCUITS

In some examples, a method comprises performing a circuit function via a circuit; and estimating a remaining life of the circuit. Moreover, estimating the remaining life of the circuit may include measuring one or more circuit parameters over a period of time during operation of the circuit, and est...

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Bibliographic Details
Main Authors Kleeberger, Veit, Zalman, Rafael, Georgakos, Georg, Zettler, Thomas, Rossmeier, Ludwig, Hammerschmidt, Dirk, Gstoettenbauer, Bernhard
Format Patent
LanguageEnglish
Published 01.06.2023
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Summary:In some examples, a method comprises performing a circuit function via a circuit; and estimating a remaining life of the circuit. Moreover, estimating the remaining life of the circuit may include measuring one or more circuit parameters over a period of time during operation of the circuit, and estimating the remaining life of the circuit based on the one or more measured circuit parameters over the period of time during operation of the circuit.
Bibliography:Application Number: US202117457183