CIRCUITS AND TECHNIQUES FOR ASSESSING AGING EFFECTS IN SEMICONDUCTOR CIRCUITS

• Main Authors: Kleeberger, Veit, Zalman, Rafael, Georgakos, Georg, Zettler, Thomas, Rossmeier, Ludwig, Gstoettenbauer, Bernhard, Hammerschmidt, Dirk
• Format: Patent
• Language: English
• Published: 01.06.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the cir...