CIRCUITS AND TECHNIQUES FOR ASSESSING AGING EFFECTS IN SEMICONDUCTOR CIRCUITS

In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the cir...

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Bibliographic Details
Main Authors Kleeberger, Veit, Zalman, Rafael, Georgakos, Georg, Zettler, Thomas, Rossmeier, Ludwig, Gstoettenbauer, Bernhard, Hammerschmidt, Dirk
Format Patent
LanguageEnglish
Published 01.06.2023
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:In some examples, a method of operating a circuit may comprise performing a circuit function under normal conditions, performing the circuit function under aggravated conditions, predicting a potential future problem with the circuit function under the normal conditions based on an output of the circuit function under the aggravated conditions, and outputting a predictive alert based on predicting the potential future problem.
Bibliography:Application Number: US202117457166