ENHANCED EVANESCENT PRISM COUPLING SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY STRENGTHENED CURVED PARTS

Methods and apparatus for obtaining a corrected digital mode spectrum for a chemically strengthened (CS) substrate having a curved surface are disclosed. The methods include digitally capturing transverse magnetic (TM) and transverse electric (TE) mode spectra of the CS substrate to form a digital m...

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Bibliographic Details
Main Authors Roussev, Rostislav Vatchev, Wetmore, Nathaniel David
Format Patent
LanguageEnglish
Published 01.06.2023
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Methods and apparatus for obtaining a corrected digital mode spectrum for a chemically strengthened (CS) substrate having a curved surface are disclosed. The methods include digitally capturing transverse magnetic (TM) and transverse electric (TE) mode spectra of the CS substrate to form a digital mode spectrum image using an evanescent prism coupling system having a system calibration for measuring flat CS substrates. The method further includes establishing a calibration correction based on the difference in the digitally captured TM and TE mode spectra as compared to a reference TM and TE mode spectra for a reference CS substrate. The calibration correction is applied to the digital mode spectrum image to form the corrected digital mode spectrum image, which can be processed using the system calibration for measuring flat CS substrates to determine a refractive index profile and stress characteristics for the curved CS substrate.
Bibliography:Application Number: US202218070022