METHOD AND MONITORING DEVICE USING THE SAME FOR ESTIMATING INTRINSIC PARAMETERS OF ENCAPSULATED CAPACITOR

• Main Authors: CHUNG, Shu Hung Henry, LEE, Wai Kwan
• Format: Patent
• Language: English
• Published: 18.05.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method for estimating intrinsic parameters of an encapsulated capacitor having three capacitors is provided, comprising: inputting received first sampled current value, second sampled current value and third sampled current value, first sampled voltage value, second sampled voltage value, and thir...