METHOD AND MONITORING DEVICE USING THE SAME FOR ESTIMATING INTRINSIC PARAMETERS OF ENCAPSULATED CAPACITOR

• Main Authors: CHUNG, Shu Hung Henry, LEE, Wai Kwan
• Format: Patent
• Language: English
• Published: 18.05.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A method for estimating intrinsic parameters of an encapsulated capacitor having three capacitors is provided, comprising: inputting received first sampled current value, second sampled current value and third sampled current value, first sampled voltage value, second sampled voltage value, and third sampled voltage value corresponding to the three capacitors into a capacitor current estimating model to obtain a first capacitor current error corresponding to a first capacitor among the three capacitors, a second capacitor current error corresponding to a second capacitor among the three capacitors and a third capacitor current error corresponding to a third capacitor among the three capacitors; and inputting the first capacitor current error, the second capacitor current error and the third capacitor current error into a particle swarm optimization model to obtain a plurality of optimized parameters corresponding to the three capacitors as a plurality of intrinsic parameters of the encapsulated capacitor.