APPARATUSES, SYSTEMS, AND METHODS FOR SAMPLE TESTING

Methods, apparatuses, and systems associated with a sample testing device are provided.

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Bibliographic Details
Main Authors VENKATARAYALU, Suresh, GRUNOW, Jonathan, FENG, Chen
Format Patent
LanguageEnglish
Published 18.05.2023
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Methods, apparatuses, and systems associated with a sample testing device are provided.
Bibliography:Application Number: US202318156221