PROGRAMMABLE MACRO TEST DESIGN FOR AN INTEGRATED CIRCUIT

A system and method for using a programmable macro built-in self-test (BIST) to test an integrated circuit. The method includes receiving, by a built-in self-test (BIST) controller of an integrated circuit (IC) device from a testing equipment, a test vector of a first type for testing a first region...

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Bibliographic Details
Main Author Kan, Senwen
Format Patent
LanguageEnglish
Published 04.05.2023
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A system and method for using a programmable macro built-in self-test (BIST) to test an integrated circuit. The method includes receiving, by a built-in self-test (BIST) controller of an integrated circuit (IC) device from a testing equipment, a test vector of a first type for testing a first region of the IC device. The method includes identifying, based on the test vector of the first type, a first BIST engine of a plurality of BIST engines associated with the first region of the IC device. The method includes generating, based on the test vector of the first type, a first command of the second type. The method includes configuring, based on the first command of the second type, the first BIST engine of the plurality of BIST engines to cause the first BIST engine to perform a first set of tests on the first region of the IC device.
Bibliography:Application Number: US202117513584