METHOD AND APPARATUS FOR RECHECKING DEFECTIVE PRODUCT

Provided are a method and an apparatus for rechecking a defective product. The method includes: a display terminal receives sent image information of at least one detection image corresponding to the defective product (S110). The image information includes: an ID of the at least one detection image,...

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Bibliographic Details
Main Authors SHENG, Haifeng, ZHANG, Shunan, SU, Hao, ZHANG, Xuedong
Format Patent
LanguageEnglish
Published 09.03.2023
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Summary:Provided are a method and an apparatus for rechecking a defective product. The method includes: a display terminal receives sent image information of at least one detection image corresponding to the defective product (S110). The image information includes: an ID of the at least one detection image, and defect information corresponding to the at least one detection image. The defect information includes: a defect type of a defect in the at least one detection image, and defect coordinates of the defect in the at least one detection image. The display terminal displays the at least one detection image that is pre-stored corresponding to the defective product and marks the defect information corresponding to the at least one detection image according to the image information (S120).
Bibliography:Application Number: US202017419269