IMAGING SYSTEM WITH WIDE X-RAY BEAM AND CIRCUMFERENTIALLY ARRANGED DETECTION MECHANISM

An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-ray source in respective controlled inspection positions. A detection mechanism is adapted to acquire respective...

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Bibliographic Details
Main Authors Stamm, Michael, Ehrat, Matthias, Shedlock, Daniel, Nisius, David T, Star-Lack, Josh M, Andrews, Gregory C
Format Patent
LanguageEnglish
Published 23.02.2023
Subjects
DIAGNOSIS
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
MEDICAL OR VETERINARY SCIENCE
SURGERY
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Summary:An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-ray source in respective controlled inspection positions. A detection mechanism is adapted to acquire respective images of the multiple objects in the respective controlled inspection positions. The detection mechanism includes one or more detectors arranged circumferentially around a central axis. At least one positioning mechanism is adapted to move the multiple objects into and out of the respective controlled inspection positions.
Bibliography:Application Number: US202217821637