BLIND SCAN FOR MULTI-CARRIERS AND MULTI-TECHNOLOGIES AND SEAMLESS SIGNAL ANALYSIS

A test device for performing a bling scan includes a digital blind scan circuit. The blind scan circuit includes digital detectors for multiple cellular technologies that simultaneously perform correlation in a baseband frequency range to detect whether received RF signals include a channel of the t...

Full description

Saved in:
Bibliographic Details
Main Authors GHAEMI, Nick, KWON, Hyuck-In, KIM, Jin-Ook, CHEN, Wei
Format Patent
LanguageEnglish
Published 16.02.2023
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
Online AccessGet full text

Cover

More Information
Summary:A test device for performing a bling scan includes a digital blind scan circuit. The blind scan circuit includes digital detectors for multiple cellular technologies that simultaneously perform correlation in a baseband frequency range to detect whether received RF signals include a channel of the technologies. The test device launches, responsive to detecting a channel from the blind scan, a signal analysis or a spectrum analysis application for the channel according to a carrier frequency and a technology identified for the channel by the blind scan.
Bibliography:Application Number: US202217885913