MEASUREMENT METHOD
A method of determining a form measurement for a curved feature of an artefact. The method includes a positioning apparatus relatively moving the artefact and a measurement device relative along a curved path in a first direction, to obtain a first set of data points along the surface of the curved...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
16.02.2023
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Subjects | |
Online Access | Get full text |
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Summary: | A method of determining a form measurement for a curved feature of an artefact. The method includes a positioning apparatus relatively moving the artefact and a measurement device relative along a curved path in a first direction, to obtain a first set of data points along the surface of the curved feature, and the positioning apparatus relatively moving the artefact and the measurement device other along a curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature. The method further includes using the first and second sets of data points to determine a form measurement for the artefact. |
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Bibliography: | Application Number: US202117792182 |