MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTERFERENCE

The present invention relates to a measuring apparatus, comprising: an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals; the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by th...

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Bibliographic Details
Main Authors RIBÓ PAL, Miquel, REGUE MORRERES, Joan Ramon, PAJARES VEGA, Francisco Javier, SANCHEZ DELGADO, Albert Miquel
Format Patent
LanguageEnglish
Published 26.01.2023
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention relates to a measuring apparatus, comprising: an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals; the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by the EUT itself, to a measuring unit; the measuring unit to measure the electrical rn signals provided by the coupling network; and-a processing unit to process the N test signals and the measured electrical signals, to obtain: the electromagnetic signals, noise or EMI generated by the EUT; and-the Z, Y or S parameters of the EUT or any other meaningful set of parameters that can be computed from the aforementioned ones or from voltages and currents. The invention also relates to a measuring method adapted to perform method steps with the apparatus of the invention.
Bibliography:Application Number: US202017758253