STRUCTURED-LIGHT IMAGING SYSTEMS AND METHODS FOR DETERMINING SUB-DIFFUSE SCATTERING PARAMETERS

A method for determining sub-diffuse scattering parameters of a material includes illuminating the material with structured light and imaging remission by the material of the structured light. The method further includes determining, from captured remission images, sub-diffuse scattering parameters...

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Bibliographic Details
Main Authors Pogue, Brian William, Elliott, Jonathan T, Krishnaswamy, Venkataramanan, Paulsen, Keith D, McClatchy, III, David M, Kanick, Stephen Chad
Format Patent
LanguageEnglish
Published 19.01.2023
Subjects
DIAGNOSIS
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
MEDICAL OR VETERINARY SCIENCE
SURGERY
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Summary:A method for determining sub-diffuse scattering parameters of a material includes illuminating the material with structured light and imaging remission by the material of the structured light. The method further includes determining, from captured remission images, sub-diffuse scattering parameters of the material. A structured-light imaging system for determining sub-diffuse scattering parameters of a material includes a structured-light illuminator, for illuminating the material with structured light of periodic spatial structure, and a camera for capturing images of the remission of the structured light by the material. The structured-light imaging system further includes an analysis module for processing the images to quantitatively determine the sub-diffuse scattering parameters. A software product includes machine-readable instructions for analyzing images of remission of structured light by a material to determine sub-diffuse scattering parameters of the material.
Bibliography:Application Number: US202217948434