RADIO FREQUENCY CHIPS HAVING WAVEFORM GENERATORS FOR SELF-TESTING

Embodiments of apparatus and method for generating waveforms for self-testing of radio frequency (RF) chips are disclosed. In an example, an RF chip includes an RF front-end and a digital front-end. The digital front-end includes an inverse fast Fourier transform (IFFT) module configured to generate...

Full description

Saved in:
Bibliographic Details
Main Authors YANG, Hong Kui, GENG, Jifeng
Format Patent
LanguageEnglish
Published 17.11.2022
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
TRANSMISSION
Online AccessGet full text

Cover

More Information
Summary:Embodiments of apparatus and method for generating waveforms for self-testing of radio frequency (RF) chips are disclosed. In an example, an RF chip includes an RF front-end and a digital front-end. The digital front-end includes an inverse fast Fourier transform (IFFT) module configured to generate at least one M-point IFFT sample, where M is a positive integer, and an IFFT sample transformation module configured to generate an L-point IFFT testing signal based on the at least one M-point IFFT sample. L is a positive integer greater than M and the L-point IFFT testing signal is configured to test a function of the RF chip.
Bibliography:Application Number: US202217878289