ANALOG-TO-DIGITAL CONVERTER (ADC) TESTING

An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic t...

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Bibliographic Details
Main Authors Abhishek, Kumar, Garrity, Douglas Alan, Jin, Xiankun, Lehmann, Mark
Format Patent
LanguageEnglish
Published 17.11.2022
Subjects
BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
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Summary:An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave.
Bibliography:Application Number: US202117302729