ANALOG-TO-DIGITAL CONVERTER (ADC) TESTING
An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic t...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | English |
Published |
17.11.2022
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | An integrated circuit device includes a digital sine wave generator configured to produce portions of a digital sine wave, a combiner circuit configured to output each of the portions of the digital sine wave combined with a respective calibration code during operation in a post-production dynamic test mode, a digital to analog converter (DAC) configured to output an analog sine wave based on the output of the combiner circuit, and a test analog to digital converter (ADC) including an input terminal directly connected to the output of the DAC, and configured to generate a second digital sine wave based on the analog sine wave. |
---|---|
Bibliography: | Application Number: US202117302729 |