DATA PROCESSING DEVICE AND DATA PROCESSING METHOD FOR PROCESSING X-RAY DETECTION DATA, AND X-RAY INSPECTION APPARATUS PROVIDED WITH THE DEVICE OR METHOD
A data processing device is applied to an X-ray system which irradiates an object with continuous X-rays and processes data detected by a photon counting X-ray detection device. An n-dimensional vector corresponding to each of "n" energy regions set a spectrum of the continuous X-rays is c...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
06.10.2022
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Subjects | |
Online Access | Get full text |
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Summary: | A data processing device is applied to an X-ray system which irradiates an object with continuous X-rays and processes data detected by a photon counting X-ray detection device. An n-dimensional vector corresponding to each of "n" energy regions set a spectrum of the continuous X-rays is calculated for each detector pixel based on the data. For each search region virtually set up based on one or more detector pixels, the n-dimensional vectors at the detector pixels belonging to each search pixel are mutually vector added in the n-dimensional space. The n-dimensional representative vector representing each of the plurality of search regions is calculated. Based on the representative vectors and an unit region having a desired size virtually set in a material space with coordinate information of the degree of attenuation of the X-rays, the information indicating the amount, type and properties of the material of the object is obtained. |
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Bibliography: | Application Number: US202017607938 |