METHOD FOR ANALYZING TEST SUBSTANCE, ANALYZER, TRAINING METHOD, ANALYZER SYSTEM, AND ANALYSIS PROGRAM

Disclosed is an analytical method for analyzing a test substance contained in a measurement sample, the method comprising: generating a data set based on a plurality of optical spectra acquired from a plurality of locations in the measurement sample; inputting the data set into a deep learning algor...

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Bibliographic Details
Main Authors NAWA, Yasunori, FUJITA, Katsumasa, FUJITA, Satoshi, OKADA, Masaya, BANDO, Kazuki, IWANAGA, Shigeki, SHIMAOKA, Yuki
Format Patent
LanguageEnglish
Published 08.09.2022
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Disclosed is an analytical method for analyzing a test substance contained in a measurement sample, the method comprising: generating a data set based on a plurality of optical spectra acquired from a plurality of locations in the measurement sample; inputting the data set into a deep learning algorithm having a neural network structure; and outputting information on the test substance, on the basis of an analytical result from the deep learning algorithm.
Bibliography:Application Number: US202217686802