SUBSTRATE TEMPERATURE NON-UNIFORMITY REDUCTION OVER TARGET LIFE USING SPACING COMPENSATION

Methods and apparatus for processing a plurality of substrates are provided herein. In some embodiments, a method of processing a plurality of substrates in a physical vapor deposition (PVD) chamber includes: performing a series of reflow processes on a corresponding series of substrates over at lea...

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Main Authors KALATHIPARAMBIL, Kishor Kumar, ZHANG, Fuhong, RIKER, Martin Lee, BANGALORE UMESH, Suhas, ZHONG, Lanlan, RAO, Preetham, PETHE, Shirish A
Format Patent
LanguageEnglish
Published 18.08.2022
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Summary:Methods and apparatus for processing a plurality of substrates are provided herein. In some embodiments, a method of processing a plurality of substrates in a physical vapor deposition (PVD) chamber includes: performing a series of reflow processes on a corresponding series of substrates over at least a portion of a life of a sputtering target disposed in the PVD chamber, wherein a substrate-to-target distance in the PVD chamber and a support-to-target distance within the PVD chamber are each controlled as a function of the life of the sputtering target.
Bibliography:Application Number: US202117177875