EQUIPMENT FAILURE DIAGNOSTICS USING BAYESIAN INFERENCE

A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units, using a coincidence probability array and an event probability to identify a second processing unit of the plurality of processing units based...

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Bibliographic Details
Main Authors Medvedev, Oleg O, Sprenkel, Marcus D
Format Patent
LanguageEnglish
Published 04.08.2022
Subjects
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
HANDLING RECORD CARRIERS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
PRESENTATION OF DATA
RECOGNITION OF DATA
RECORD CARRIERS
REGULATING
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Summary:A method is described herein, comprising registering an event at a first processing unit of a processing facility comprising a plurality of processing units, using a coincidence probability array and an event probability to identify a second processing unit of the plurality of processing units based on the event, determining whether the second processing unit experienced a coincident event, if the second processing unit experienced a coincident event, remediating a condition of the second processing unit that caused the coincident event, and updating the coincidence probability array based on the event.
Bibliography:Application Number: US202017595536