METHOD FOR CONTROLLING A SEMICONDUCTOR-LASER-DIODE-BASED SS- INTERFEROMETER SYSTEM
The invention relates to a method for controlling a semiconductor-laser-diode-based SS-interferometer system (SS=swept source), which allows for a wide range of application and is suitable for use in ophthalmology, in particular for imaging and for determining biometric measurement values of the eye...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
04.08.2022
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to a method for controlling a semiconductor-laser-diode-based SS-interferometer system (SS=swept source), which allows for a wide range of application and is suitable for use in ophthalmology, in particular for imaging and for determining biometric measurement values of the eye. In the method according to the invention, by means of periodic current modulation, the operation of single semiconductor laser diodes is designed such that a highly coherent spectral laser line can be adjusted with a highest possible repetition rate and over a wide wavelength range. In addition, the following parameters: centre wavelength, sweep rate, sweep range, optical power in the eye and coherence length are adjusted such that the method is suitable for imaging and biometric applications via whole-eye scans. The proposed semiconductor-laser-diode-based SS-interferometer system is provided, in particular, for biometric measuring of the eye. Given that the embodiments are based preferably on optical, coherence tomographic scan images, the main application lies in opthalmological diagnostics, treatment and the preparation of surgical procedures and follow-up thereof. |
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Bibliography: | Application Number: US202017433776 |