SEMICONDUCTOR DEVICE

There is provided a semiconductor device capable of improving the performance and/or reliability of the element, by increasing the capacitance of the capacitor, using a capacitor dielectric film including a ferroelectric material and a paraelectric material. The semiconductor device includes first a...

Full description

Saved in:
Bibliographic Details
Main Authors JUNG, Hyung Suk, LIM, Han Jin, KIM, Ki Nam, JUNG, Kyoo Ho, HWANG, Ki Hyun
Format Patent
LanguageEnglish
Published 21.07.2022
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:There is provided a semiconductor device capable of improving the performance and/or reliability of the element, by increasing the capacitance of the capacitor, using a capacitor dielectric film including a ferroelectric material and a paraelectric material. The semiconductor device includes first and second electrodes disposed to be spaced apart from each other, and a capacitor dielectric film disposed between the first electrode and the second electrode and including a first dielectric film and a second dielectric film. The first dielectric film includes one of a first monometal oxide film and a first bimetal oxide film, the first dielectric film has an orthorhombic crystal system, the second dielectric film includes a paraelectric material, and a dielectric constant of the capacitor dielectric film is greater than a dielectric constant of the second dielectric film.
Bibliography:Application Number: US202217714259