DEFECT DETECTION FOR MULTI-FUNCTION DEVICES USING MACHINE LEARNING

A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known...

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Bibliographic Details
Main Authors Moore, Lee C, Conlon, Paul Roberts, Craig, David C, Robles Flores, Eliud
Format Patent
LanguageEnglish
Published 23.06.2022
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
PICTORIAL COMMUNICATION, e.g. TELEVISION
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Summary:A method is disclosed. For example, the method executed by a processor of a multi-function device (MFD) includes executing a defect learning routine to identify defects, cataloging the defects based on a job function, a type of paper, and a machine state, receiving a job request, determining a known defect that has been catalogued based on the job function, the type of paper, and the machine state, and presenting a visualization of the known defect on a display of a user interface before executing the job request.
Bibliography:Application Number: US202117451939