NANOWIRE INK PERFORMANCE CORRELATION TO NANOWIRE DIMENSION

A method for predicting at least one performance property of a transparent conductive film to be made from an ink containing nanowires prior to making the transparent conductive film. The method includes obtaining a nanowire population from the ink for analysis. The method includes determining at le...

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Bibliographic Details
Main Authors SPAID, Michael Andrew, WOLK, Jeff Alan
Format Patent
LanguageEnglish
Published 26.05.2022
Subjects
ADHESIVES
BASIC ELECTRIC ELEMENTS
CABLES
CHEMICAL PAINT OR INK REMOVERS
CHEMISTRY
COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS
CONDUCTORS
CORRECTING FLUIDS
DYES
ELECTRICITY
FILLING PASTES
INKS
INSULATORS
METALLURGY
MISCELLANEOUS APPLICATIONS OF MATERIALS
MISCELLANEOUS COMPOSITIONS
NATURAL RESINS
PAINTS
PASTES OR SOLIDS FOR COLOURING OR PRINTING
POLISHES
SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES
USE OF MATERIALS THEREFOR
WOODSTAINS
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Summary:A method for predicting at least one performance property of a transparent conductive film to be made from an ink containing nanowires prior to making the transparent conductive film. The method includes obtaining a nanowire population from the ink for analysis. The method includes determining at least one of lengths and diameters for all the nanowires within the population from the ink. The method includes comparing the determined at least one of lengths and diameters to a value index that is correlated to the at least one performance property of the to-be-made transparent conductive film.
Bibliography:Application Number: US202017600742