METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT

A method for measuring interfaces of an optical element, forming part of a plurality of similar elements including at least one reference optical element, the method implemented by a device, the method including:relative positioning of each reference optical element and the measurement beam, to allo...

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Bibliographic Details
Main Authors PETITGRAND, Sylvain, FRESQUET, Gilles
Format Patent
LanguageEnglish
Published 05.05.2022
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:A method for measuring interfaces of an optical element, forming part of a plurality of similar elements including at least one reference optical element, the method implemented by a device, the method including:relative positioning of each reference optical element and the measurement beam, to allow a measurement of interfaces of each reference optical element;acquisition of a reference image, of each reference element;positioning of the measured optical element to allow acquisition of a measurement image, of the optical element to be measured;determining a difference of position in a field of view of the measured element with respect to each reference optical element, based on the reference and measurement images;adjusting the position of the measured optical element in the field of view to cancel the difference of position; andmeasuring the interfaces of the measured optical element by the measurement beam.
Bibliography:Application Number: US202017310920