ANALYSIS METHOD, ANALYSIS DEVICE, AND PROGRAM

Disclosed is an analysis method for ionizing a sample arranged in an ionizing unit of an analysis device in a state where the sample is in contact with a solvent to perform analyzation. The method includes a first mass analysis step of obtaining first measurement data by causing the solvent not in c...

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Bibliographic Details
Main Authors MURATA, Tasuku, FUJITA, Shinjiro
Format Patent
LanguageEnglish
Published 28.04.2022
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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Summary:Disclosed is an analysis method for ionizing a sample arranged in an ionizing unit of an analysis device in a state where the sample is in contact with a solvent to perform analyzation. The method includes a first mass analysis step of obtaining first measurement data by causing the solvent not in contact with the sample to adhere to a probe, and then performing mass analysis to the solvent adhering to the probe, a second mass analysis step, performed subsequently to the first mass analysis step, of obtaining second measurement data by causing the sample in the solvent to adhere to the probe or causing the sample adhering to the probe to be brought into contact with the solvent, and then performing mass analysis to the solvent and the sample adhering to the probe, and a measurement data generation step of generating measurement data, associated with the sample, based on the first measurement data and the second measurement data.
Bibliography:Application Number: US201817271836