SYSTEMS AND METHODS FOR CONTRAST FLOW MODELING WITH DEEP LEARNING
Systems and methods are provided for contrast-enhanced diagnostic imaging. In one aspect, a system comprises an x-ray source that emits a beam of x-rays towards a subject to be imaged; a detector that receives the x-rays attenuated by the subject; a data acquisition system (DAS) operably connected t...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
21.04.2022
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Subjects | |
Online Access | Get full text |
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Summary: | Systems and methods are provided for contrast-enhanced diagnostic imaging. In one aspect, a system comprises an x-ray source that emits a beam of x-rays towards a subject to be imaged; a detector that receives the x-rays attenuated by the subject; a data acquisition system (DAS) operably connected to the detector; and a computing device operably connected to the DAS and configured with executable instructions in non-transitory memory that when executed cause the computing device to generate a first estimated time to perform a diagnostic scan of the subject based on demographic information and clinical information of the patient; and control the x-ray source and the detector to perform the diagnostic scan of the subject at the first estimated time responsive to a first confidence level of the first estimated time above a threshold. |
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Bibliography: | Application Number: US202117563970 |