Two-Dimensional Material Detector Based on Asymmetrically Integrated Optical Microstrip Antenna

The present disclosure provides a two-dimensional material detector with an asymmetrically integrated optical microstrip antenna, structurally including a metal reflecting surface, a dielectric spacer layer, a two-dimensional active material layer, a top source electrode, and a drain electrode integ...

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Main Authors Guo, Shangkun, Lan, Mengke, Deng, Jie, Li, Fangzhe, Chen, Xiaoshuang, Dai, Xu, Ji, Zhaoyu, Yu, Yu, Chu, Zeshi, Zhou, Jing, Cai, Qingyuan
Format Patent
LanguageEnglish
Published 17.03.2022
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Summary:The present disclosure provides a two-dimensional material detector with an asymmetrically integrated optical microstrip antenna, structurally including a metal reflecting surface, a dielectric spacer layer, a two-dimensional active material layer, a top source electrode, and a drain electrode integrated with a metal strip array. Self-driven photoresponse of a metal/two-dimensional material/metal structure is induced by a Schottky junction formed due to contact between the two-dimensional material and the metal. The asymmetrically integrated optical microstrip antennas break the symmetry between the two contact/two-dimensional material junctions. Light absorption in the contact/two-dimensional material junction integrated with optical patch antennas is significantly enhanced by efficient light in-coupling and intensified light localization; meanwhile, the extended boundary of the contact/two-dimensional material junction enlarges the photocurrent collection area. The light absorption in the other contact/two-dimensional material junction is significantly inhibited by a metal bottom surface which is very close to the two-dimensional material.
Bibliography:Application Number: US202117447731