EVALUATING SURFACES
In an example, a surface inspection apparatus includes a light source to illuminate a portion of a surface in a print apparatus, a light detection apparatus and processing circuitry. The light detection apparatus may receive diffusely reflected light and specularly reflected light from the portion o...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
17.03.2022
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Subjects | |
Online Access | Get full text |
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Summary: | In an example, a surface inspection apparatus includes a light source to illuminate a portion of a surface in a print apparatus, a light detection apparatus and processing circuitry. The light detection apparatus may receive diffusely reflected light and specularly reflected light from the portion of the surface, and may comprise a detection element for detecting the specularly reflected light. The processing circuitry may comprise a comparison module to determine a relationship between an intensity of the detected diffusely reflected light and the detected specularly reflected light and a quality module to evaluate if the surface meets a quality criterion based on the relationship. |
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Bibliography: | Application Number: US201917416553 |