HIGH SENSITIVITY FREQUENCY-DOMAIN SPECTROSCOPY SYSTEM

• Main Authors: Wathen, Jeremiah J, Hendrickson, Scott M, Pagan, Vincent R, Fitch, Michael J, Blodgett, David W
• Format: Patent
• Language: English
• Published: 10.02.2022
• Subjects: COLORIMETRY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS; OPTICS; PHYSICS; RADIATION PYROMETRY; TESTING

A system includes first and second radiation sources, first and second detectors, a signal digitizer, a controller, and an analyzer. The first and second radiation sources generate respective first and second beams of radiation to irradiate a target. The first beam and second beams each include a fi...