HIGH SENSITIVITY FREQUENCY-DOMAIN SPECTROSCOPY SYSTEM

A system includes first and second radiation sources, first and second detectors, a signal digitizer, a controller, and an analyzer. The first and second radiation sources generate respective first and second beams of radiation to irradiate a target. The first beam and second beams each include a fi...

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Bibliographic Details
Main Authors Wathen, Jeremiah J, Hendrickson, Scott M, Pagan, Vincent R, Fitch, Michael J, Blodgett, David W
Format Patent
LanguageEnglish
Published 10.02.2022
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:A system includes first and second radiation sources, first and second detectors, a signal digitizer, a controller, and an analyzer. The first and second radiation sources generate respective first and second beams of radiation to irradiate a target. The first beam and second beams each include a first wavelength operated at a first modulation frequency and a second wavelength operated at a second modulation frequency. The first and second detectors each include a photo-sensitive element that generate first or second detection signals, a Faraday shielding enclosure, a signal amplifier, and a frequency mixer to frequency-adjust the first or second detection signals. The controller provides timing information to inform an activation scheme of the first and second radiation sources and corresponding radiation detection events at the first and second detectors. The analyzer analyzes the first and second detection signals and determines at least amplitude and phase information of the scattered radiation.
Bibliography:Application Number: US202117394143