MEASUREMENT APPARATUS AND METHOD

A measurement apparatus for mounting within an enclosure of a machine is described. The apparatus includes a measurement device and a protection means for protecting the measurement device from contaminants present within the machine enclosure. The protection means is switchable between at least a f...

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Bibliographic Details
Main Authors FERGUSON, Graham Richard, MERRIFIELD, Benjamin Jason
Format Patent
LanguageEnglish
Published 09.12.2021
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Summary:A measurement apparatus for mounting within an enclosure of a machine is described. The apparatus includes a measurement device and a protection means for protecting the measurement device from contaminants present within the machine enclosure. The protection means is switchable between at least a first mode that protects the measurement device from contaminants and a second mode that provides less protection of the measurement device from contaminants than the first mode. A contaminant sensor is used for sensing contamination within the machine enclosure and thereby determining when the protection means can adopt the second mode. A corresponding method is also described.
Bibliography:Application Number: US202017431947