WAFER CLEANING APPARATUS AND METHOD

The present disclosure relates to an apparatus for wafer cleaning. The apparatus includes an enclosure made of a noncombustible material, a wafer holder, a cleaning nozzle, at least one sensor, and an exhaust unit. The wafer holder can hold and heat a wafer. The cleaning nozzle can supply a flow of...

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Bibliographic Details
Main Authors HUANG, Jieh-Chau, HSIA, Ying Ting, HU, Hung-Lung, HUANG, Ping-Jing, YEN, Bi-Ming, HSIA, Pei Yen
Format Patent
LanguageEnglish
Published 07.10.2021
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Summary:The present disclosure relates to an apparatus for wafer cleaning. The apparatus includes an enclosure made of a noncombustible material, a wafer holder, a cleaning nozzle, at least one sensor, and an exhaust unit. The wafer holder can hold and heat a wafer. The cleaning nozzle can supply a flow of a cleaning fluid onto a surface of the wafer. The at least one sensor can detect attributes of the wafer. The exhaust unit can expel a vapor generated by the cleaning fluid in the enclosure. The exhaust unit can include a rinse nozzle to rinse the vapor passing through the exhaust unit with a mist.
Bibliography:Application Number: US202117350036