SEMICONDUCTOR CLEANING EQUIPMENT AND METHOD FOR CLEANING THROUGH VIAS USING THE SAME

A method for cleaning a through via including the following steps is provided: heating a cleaning fluid to a predetermined temperature; mixing the cleaning liquid with an inert gas and entering into a cleaning cavity; atomizing the cleaning liquid in an atomizer to spray on a wafer surface and to we...

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Bibliographic Details
Main Authors YAO, Daping, CAO, Liqiang
Format Patent
LanguageEnglish
Published 23.09.2021
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Summary:A method for cleaning a through via including the following steps is provided: heating a cleaning fluid to a predetermined temperature; mixing the cleaning liquid with an inert gas and entering into a cleaning cavity; atomizing the cleaning liquid in an atomizer to spray on a wafer surface and to wet an inner wall and a bottom of the through via; and closing a cleaning liquid valve.
Bibliography:Application Number: US201817258449